Piotr Putek

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In this paper we focus on incorporating a stochastic collocation method (SCM) into a topology optimization for a power semiconductor device with both material and geometrical uncertainties. Such geometrical and material variations, which result predominantly from lithography proximity and process imperfections, have a direct impact on its yield and(More)
E Jan W ter Maten , Piotr A Putek, Michael Günther, Roland Pulch, Caren Tischendorf, Christian Strohm, Wim Schoenmaker, Peter Meuris, Bart De Smedt, Peter Benner, Lihong Feng, Nicodemus Banagaaya, Yao Yue, Rick Janssen, Jos J Dohmen, Bratislav Tasić, Frederik Deleu, Renaud Gillon, Aarnout Wieers, Hans-Georg Brachtendorf, Kai Bittner, Tomáš Kratochvíl, Jiří(More)
In this paper we focus on a shape/topology optimization problem of a power MOS transistor under geometrical and material uncertainties to reduce the current density overshoot. This problem, occurring in the automotive industry, yields a stochastic electro-thermal coupled problem. Its solution enables to investigate the propagation of uncertainties through a(More)
Our ultimate goal is a topology optimization for a permanent-magnet (PM) machine, while including material uncertainties. The uncertainties in the output data are, e.g., due to measurement errors in the non-/linear material laws. In the resulting stochastic forward problem, these uncertainties are stochastically modeled by random fields. The solution of the(More)
This paper focuses on the application of the variance-based global sensitivity analysis for a topology derivative method in order to solve a stochastic nonlinear time-dependent magnetoquasistatic interface problem. To illustrate the approach a permanent magnet synchronous machine has been considered. Our key objective is to provide a robust design of rotor(More)
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