Pinshan Jiang

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section. In this paper we propose an efJicient algorithm for scheduling a flying test probe for unpopulated multi-chip module (MCM) substrates. Our ob.jective is to reduce the total time of MCM substrate testing by optimizing the traveling path of the probe. This paper first describes two algorithms: Lin-Kernighan (LK) and Simulated Annealing (SA). We then(More)
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