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A new test system was devised and used to separate the amount of floating gate (FG) charge (QFG) from the oxide trapped charge (QOX) generated by program-and-erase (P/E) cycles. We also extracted the… Continue Reading
It has been newly found that shorter intervals between program and erase operations can suppress the oxide degradation more significantly in a 0.05 to 5 sec timeframe. Our new analysis clearly… Continue Reading
The CeF3 nanoplates with hexagonal shape have been successfully synthesized by an ultrasound vibration assisted hydrothermal process. In situ high pressure angle-dispersive synchrotron x-ray… Continue Reading
A method to analyze the kinetics of the charge accumulation in the tunnel oxide by the nand flash memory program and erase (P/E) cycling is proposed. Both electron trapping and detrapping processes… Continue Reading