This paper presents a HSPICE macromodel of a phase change memory (PCM) cell. The model simulates not only the resistance change by phase (as corresponding to the two states, amorphous and crystalline), but also the temperature profile, the crystalline fraction during the programming and the drift behavior in resistance and threshold voltage. The proposed… (More)
This paper presents a new HSPICE macromodel of a Programmable Metalization Cell (PMC). The electrical characteristics of a PMC are simulated by using a geometric model that considers the vertical and lateral growth/disolution of the metallic filament. The selection of the parameters is based on operational features, so the electrical characterization of the… (More)
and correction capabilities; CED is accomplished using a dual-rail checker, while correction is accomplished by utilizing the restore operation; data from the non-volatile memory element is copied back to the SRAM core. The dual-rail checker utilizes two XOR gates each made of 2 inverters and 2 ambipolar transistors, hence, it has a hybrid nature. Extensive… (More)
This paper presents a Ternary Content Addressable Memory (TCAM) cell that employs memristors as storage element. The TCAM cell requires two memristors in series to perform the traditional memory operations (read and write) as well as the search and matching operations for TCAM; this memory cell is analyzed with respect to different features (such as… (More)
accomplished by utilizing the restore operation, such that data from the non-volatile memory element is copied back to the SRAM core. The simulation results show that the proposed scheme is very efficient in terms of numerous figures of merit.
This paper presents the novel design of a Ternary Content Addressable Memory (TCAM); different from existing designs found in the technical literature, this cell utilizes a single Phase Change Memory (PCM) as storage element and ambipolarity for comparison. A memory core consisting of a CMOS transistor and a PCM is employed (1T1P); for the search operation,… (More)
—This paper presents a system-level scheme to alleviate the effect of resistance drift in a multilevel phase change memory (PCM) for data integrity. In this paper, novel criteria of separation of the PCM resistance for multilevel cell storage and selection of the threshold resistances between levels are proposed by using a median based method based on a row… (More)