Pierre Soufflet

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In the automotive industry, risk analysis are performed as soon as quality incidents with the same defect signature are reported from the field. The tools used may be the defect distribution modeling, used for the failure rate estimations required by ISO26262 standard, but adapted to the stronger constraints of quality issues. One of these constraints is(More)
In semiconductor manufacturing for automotive, reliability constraints are strong: zero defect is expected by specific statistical techniques. In particular, distributions of the parametric electrical tests implemented at the probe or assembly steps, are controlled, test by test. In order to increase reliability in field by enhancement of potential failure(More)
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