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A method for statistical fault injection (SFI) into arbitrary latches within a full system hardware-emulated model is validated against particle-beam-accelerated SER testing for a modern microprocessor. As performed on the IBM POWER6 microprocessor, SFI is capable of distinguishing between error handling states associated with the injected bit flip.(More)
This paper will provide a case study of a particularly dificult debug problem (the Holey Shmoo problem) which developed while designing the IBM System1390 G6 637MH.z microprocessor chip. Resolution of this problem involved the use of some of today’s newest DFDIDFT and diagnostics techniques. The discussion of the Holey Shmoo problem and its debug will serve(More)
This paper presents a fast, low-power, binary carrylookahead, 64-bit dynamic parallel adder architecture for highfrequency microprocessors. The adder core is composed of evaluate circuits and feedback reset chains implemented by selfresetting CMOS (SRCMOS) circuits with enhanced testability. A new tool, SRCMOS pulse analyzer (SPA), is developed for checking(More)
Radiation-induced soft errors are getting worse in digital systems manufactured in advanced technologies. Stringent data integrity and availability requirements of enterprise computing and networking applications demand special attention to soft errors in sequential elements and combinational logic. This tutorial will discuss the impact of technology(More)
Backside light emission and electrical measurements were used to evaluate the susceptibility to latchup of externally cabled I/O pins for a 0.13 μm technology generation [1,2] test chip, which was designed in a flip-chip package. Case studies of several Inputs/Outputs (I/Os) are shown along with conclusions regarding layout and floorplanning to ensure the(More)
No matter whether the designer thinks analogue or digital, he is faced with the DfM issue. Although confronted with different challenges, the key for satisfying yield in production lies in the design phase. Tools, techniques, and methods that once worked without fail cannot hold up any longer. More of the responsibility for yield must shift to the designer,(More)