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A method for statistical fault injection (SFI) into arbitrary latches within a full system hardware-emulated model is validated against particle-beam-accelerated SER testing for a modern microprocessor. As performed on the IBM POWER6 microprocessor, SFI is capable of distinguishing between error handling states associated with the injected bit flip.(More)
—This paper presents a fast, low-power, binary carry-lookahead, 64-bit dynamic parallel adder architecture for high-frequency microprocessors. The adder core is composed of evaluate circuits and feedback reset chains implemented by self-resetting CMOS (SRCMOS) circuits with enhanced testability. A new tool, SRCMOS pulse analyzer (SPA), is developed for(More)
Radiation-induced soft errors are getting worse in digital systems manufactured in advanced technologies. Stringent data integrity and availability requirements of enterprise computing and networking applications demand special attention to soft errors in sequential elements and combinational logic. This tutorial will discuss the impact of technology(More)
Backside light emission and electrical measurements were used to evaluate the susceptibility to latchup of externally cabled I/O pins for a 0.13 µm technology generation [1,2] test chip, which was designed in a flip-chip package. Case studies of several Inputs/Outputs (I/Os) are shown along with conclusions regarding layout and floorplanning to ensure the(More)
OBJECTIVE To evaluate the consequences for antibiotic efficacy of different types of poor adherence to a short-term dosing regimen. Ciprofloxacin was taken as an example. METHOD A simulation study on a 2-compartment pharmacokinetic model and parameter estimates taken from the literature was performed. Two empirical efficacy measures as well as a specific(More)