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This work reports real-time soft-error rate (SER) testing of semiconductor static memories in both altitude and underground environments to separate the component of the SER induced by the cosmic rays (i.e. primarily by atmospheric neutrons) from that caused by on-chip radioactive impurities (alpha-particle emitters). Two European dedicated sites were used(More)
—This paper presents a study using alpha-and neutron-accelerated tests to characterize the soft error rate (SER) of flip-flops (FFs) that are used in 90-nm CMOS production designs. The investigated FFs differ in circuit schematic, threshold voltage (V T), drive strength, and cell height. Both the alpha-and the neutron-induced SER of FFs on a dedicated 90-nm(More)
BACKGROUND In the last decade, the inhibition of protein-protein interactions (PPIs) has emerged from both academic and private research as a new way to modulate the activity of proteins. Inhibitors of these original interactions are certainly the next generation of highly innovative drugs that will reach the market in the next decade. However, in silico(More)
Protein-protein interactions are considered as one of the next generation of therapeutic targets. Specific tools thus need to be developed to tackle this challenging chemical space. In an effort to derive some common principles from recent successes, we have built 2P2Idb (freely accessible at http://2p2idb.cnrs-mrs.fr), a hand-curated structural database(More)