Philip C. Murley

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A new formalism for the calculation of the ion-matter interaction phenomenon was developed by incorporating the atomic electron shell structure. This formalism allows for discrimination among the electrons of the target atoms according to their average positions with respect to the shell structure of the projectile ion. By doing so, we are able to show a(More)
Monte Carlo methods of statistical analysis are applied to the problems of transistor design and optimization. The experimental tolerances associated with any diffusion process are shown to represent an important factor in the initial design of diffused junction transistors. Many transistor parameters exhibit a substantial degree of sensitivity to small(More)
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