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for MCMs, and high-reliability applications. Further, defect clustering based strategies may dso be able to screen for potential burn-in failures, thereby eliminating the need for expensive burn-in of bare dice. Finally, this approach is orthogonal to other techniques for improving test effectiveness, and can screen for de(UP to an order of magnitude)(More)
The SEMATECH “Test Methods Evaluation” study, Project Number S-121, is an experiment to determine the relative merits of several test methodologies often used by SEMATECH member companies and other IC manufacturers. Conclusions drawn from the experiment thus far have indicated that each test methodology uniquely detects defects. Thisexperimentation and(More)