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A blueprint for an atomistic approach to introducing time-dependent variability into a circuit simulator in a realistic manner is demonstrated. The approach is based on previously proven physics of stochastic properties of individual gate oxide defects and their impact on FET operation. The proposed framework is capable of following defects with widely(More)
The design of analog front-ends of digital telecommunica-tion transceivers requires simulations at the architectural level. The nonlinear nature of the analog front-end blocks is a complication for their modeling at the architectural level, especially when the nonlinear behavior is frequency dependent. This paper describes a method to derive a bottom up(More)
Anticipating silicon response in the presence or process variability is essential to avoid costly silicon re-spins. EDA industry is trying to provide the right set of tools to designers for statistical characterization of SRAM and logic. Yet design teams (also in foundries) are still using classical corner based characterization approaches. On the one hand(More)
The architectural study of wireless communication systems typically requires simulations with high-level models for different analog and RF blocks. Among these blocks, frequency-translating devices such as mixers pose problems in RF circuit simulation since their response typically covers a mix of long- and short-time scales. This paper proposes a technique(More)
  • Rüdiger Glaser ·Dirk, Johannes Schönbein, +5 authors Kotyza ·Danuta
  • 2010
The paper presents a qualitative and quantitative analysis of flood variability and forcing of major European rivers since AD 1500. We compile and investigate flood reconstructions which are based on documentary evidence for twelve Central European rivers and for eight Mediterranean rivers. Flood variability and underlying climatological causes are(More)
The explosion of the telecommunications market requires miniaturization and cost-effective realization of the front-ends of transceivers for digital telecommunications. New architectures must therefore be simulated at high level. Current methodologies and corresponding tools suffer from common drawbacks, such as lower accuracy, slow simulation speed, etc. A(More)
This paper presents an automated technique to perform SRAM wide statistical analysis in presence of process variability. The technique is implemented in a prototype tool and is demonstrated on several 45 and 32nm industry-grade SRAM vehicles. Selected case studies show how this approach successfully captures non-trivial statistical interactions between the(More)