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This paper compares three heuristic search algorithms: genetic algorithm (GA), simulated annealing (SA) and tabu search (TS), for hardware-software partitioning. The algorithms operate on functional blocks for designs represented as directed acyclic graphs, with the objective of minimising processing time under various hardware area constraints. The(More)
This paper describes a framework and tools for automating the production of designs which can be partially reconngured at run time. The tools include: i a partial evaluator, which produces connguration les for a given design, where the number of conngurations can be minimised by a process known as compile-time sequencing; ii an incremental connguration(More)
This paper introduces a heuristic to solve the combined scheduling, resource binding, and wordlength selection problem for multiple wordlength systems. The algorithm involves an iterative refinement of operator wordlength information , leading to a scheduled and bound data-flow graph. Scheduling is performed with incomplete wordlength information during the(More)
The study examines the relationship between hallucinations/delusions and violent behaviour in a sample of long-stay inpatients with chronic schizophrenia. Thirty-one subjects defined as violent and meeting DSM-111-R criteria for schizophrenia were compared with 31 matched non-violent schizophrenia patients with respect to detailed phenomenologies of(More)
—This paper presents an approach to the wordlength allocation and optimization problem for linear digital signal processing systems implemented as custom parallel processing units. Two techniques are proposed, one which guarantees an optimum set of wordlengths for each internal variable, and one which is a heuristic approach. Both techniques allow the user(More)
This paper presents an analysis of the potential yield loss in FPGA due to random defects in metal layers. A proven yield model is adapted to target the FPGA interconnect layers in order to predict the manufacturing yield. Defect parameters from the 2003 SIA roadmap are used to investigate the trend in yield loss due to defects in interconnect layers in the(More)