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We describe the electrical failure of thin films as a percolation in two-dimensional random resistor networks. We show that the resistance evolution follows a scaling relation expressed as R approximately epsilon(-&mgr;) where epsilon = (1-t/tau), tau is the time of electrical failure of the film, and &mgr; is the same critical exponent appearing in the(More)
In a random resistor network we consider the simultaneous evolution of two competing random processes consisting in breaking and recovering the elementary resistors with probabilities W(D) and W(R). The condition W(R)>W(D)/(1+W(D)) leads to a stationary state, while in the opposite case, the broken resistor fraction reaches the percolation threshold p(c).(More)
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