- Full text PDF available (2)
This paper reviews recent experiments that have shown that the probable mechanism for low voltage trap generation and dielectric breakdown is anode hydrogen release. Vibrational excitation of silicon-hydrogen bonds is the process that provides the most plausible explanation for the existence of a power law model for TDDB.
ACKNOWLEDGEMENTS In my professional journey, I have been fortunate in having the opportunity to spend the past 22 years in the employ of Texas Instruments Incorporated. In this environment, I have worked with, learned from, and been nurtured by many extraordinarily talented individuals. I have also benefited from interactions with researchers from other… (More)