Pankajkumar Pradhan

We don’t have enough information about this author to calculate their statistics. If you think this is an error let us know.
Learn More
It was brought to the authors' attention that the original paper contains the following errors. (i) We reported a 0.05% electron density contrast between silicon and boron carbide. There was a calculation error in computing this number and the correct contrast is 0.5%. This is one order of magnitude lower than what can be studied using hard x-ray(More)
We present precise measurements of atomic distributions of low electron density contrast at a buried interface using soft x-ray resonant scattering. This approach allows one to construct chemically and spatially highly resolved atomic distribution profile upto several tens of nanometer in a non-destructive and quantitative manner. We demonstrate that the(More)
This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article's Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the(More)
  • 1