• Publications
  • Influence
Conditions and reasons for incoherent imaging in STEM
Abstract The origin of incoherent imaging in STEM has been analysed by investigating the effects of the detector geometry and of the thermal vibrations of the atoms on the image formation. TheExpand
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Advancing the hexapole Cs-corrector for the scanning transmission electron microscope.
Aberration correctors using hexapole fields have proven useful to correct for the spherical aberration in electron microscopy. We investigate the limits of the present design for the hexapoleExpand
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Information transfer in a TEM corrected for spherical and chromatic aberration.
For the transmission electron aberration-corrected microscope (TEAM) initiative of five U.S. Department of Energy laboratories in the United States, a correction system for the simultaneousExpand
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Thermal magnetic field noise limits resolution in transmission electron microscopy.
The resolving power of an electron microscope is determined by the optics and the stability of the instrument. Recently, progress has been obtained towards subångström resolution at beam energies ofExpand
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  • Open Access
XPEEM WITH ENERGY-FILTERING: ADVANTAGES AND FIRST RESULTS FROM THE SMART PROJECT
The second development step of the SMART project, i.e. an energy-filtered but not yet corrected photoelectron emission microscope, operates at the undulator U49/1-PGM beamline at BESSY II. It alreadyExpand
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  • Open Access
SMART: a planned ultrahigh-resolution spectromicroscope for BESSY II
Abstract A new UHV spectromicroscope called SMART (spectromicroscope for all relevant techniques) is currently under construction for a soft X-ray undulator beamline at BESSY II. The instrumentExpand
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SMART: An Aberration-Corrected XPEEM/LEEM with Energy Filter
A new UHV spectroscopic X-ray photoelectron emission and low energy electron microscope is presently under construction for the installation at the PM-6 soft X-ray undulator beamline at BESSY II.Expand
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π/2 mode converters and vortex generators for electrons.
In optics, mode conversion is an elegant way to switch between Hermite Gaussian and Laguerre Gaussian beam profiles and thereby impart orbital angular momentum onto the beam and to create vortices.Expand
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  • Open Access
Detection of single atoms and buried defects in three dimensions by aberration-corrected electron microscope with 0.5-A information limit.
The ability of electron microscopes to analyze all the atoms in individual nanostructures is limited by lens aberrations. However, recent advances in aberration-correcting electron optics have led toExpand
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  • Open Access
Chromatic Aberration Correction for Atomic Resolution TEM Imaging from 20 to 80 kV.
Atomic resolution in transmission electron microscopy of thin and light-atom materials requires a rigorous reduction of the beam energy to reduce knockon damage. However, at the same time, theExpand
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  • Open Access