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GaN devices exhibit excellent potential for use in many RF applications. However, commercial acceptance of the technology has been hindered by the scarcity and non-statistical nature of reliability results. In this work we present a full device level reliability study of GaN-on-Si HFETs. Reliability results on this technology include three-temperature DC(More)
In this paper, the qualification of a production GaN process platform is discussed. Details of the process repeatability, reliability and qualification methodologies are covered in detail. Additionally, concurrent product development efforts are also described. Reliability results include three-temperature DC testing that resulted in an activation energy of(More)
This paper presents a simple, generic source-based end-to-end multicast congestion control GSC algorithm for reliable multicast transport RMT protocols. The algorithm is completely implemented at the source and leverages the reverse control information ow in RMT protocols like PGM or RMTP 13,444. Speciically, i t d o e s not introduce any new control traac(More)
This paper presents a simple, generic source-based end-to-end multicast congestion control (SBMCC) algorithm for reliable multicast transport (RMT) protocols. The algorithm is completely implemented at the source and leverages the reverse control information ow in RMT protocols like PGM or RMTP 13, 43]. Speciically, it does not introduce any new control(More)
This paper provides an overview of the Nitronex power transistor process and discusses in detail the approaches taken to optimize performance for 28V linear applications. More specifically, key process performance metrics are traced through several generations of baseline process, highlighting some of the challenges met along the way, and concluding with a(More)
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