P. D. Hyde

Learn More
Exploring assessment in flexible delivery of vocational education and training programs programs flexible education assessment exploring training delivery delivery training vocational flexible programs education this publication may be reported by any process without the written permission of NCVER Ltd. Requests should be made in writing to NCVER Ltd. The(More)
The use of deep submicron technology raises a number of concerns about reliability in VLSI circuits. Shrinking geometries and reduced power supplies leave the circuits vulnerable to 'soft' and transient errors. The combination of high clock speed and large circuit area result in high power consumption and skew in clock distribution. This paper investigates(More)
  • 1