Orlando Auciello

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Most MEMS devices are currently based on silicon because of the available surface machining technology. However, Si has poor mechanical and tribological properties which makes it difficult to produce high performance Si based MEMS devices that could work reliably, particularly in harsh environments; diamond, as a superhard material with high mechanical(More)
A. V. Sumant,1,* D. S. Grierson,1 J. E. Gerbi,2,† J. A. Carlisle,2,3,‡ O. Auciello,2,3 and R. W. Carpick1,§ 1Department of Engineering Physics, University of Wisconsin–Madison, Wisconsin 53706, USA 2Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439, USA 3Center for Nanoscale Materials, Argonne National Laboratory, Argonne,(More)
The surface functionalization of ultrananocrystalline diamond (UNCD) thin films via the electrochemical reduction of aryl diazonium cations is described. The one-electron-transfer reaction leads to the formation of solution-based aryl radicals, which in turn react with the UNCD surface forming stable covalent C-C bonds. Cyclic voltammetry (CV), X-ray(More)
Diamond, because of its electrical and chemical properties, may be a suitable material for integrated sensing and signal processing. But methods to control chemical or biological modifications on diamond surfaces have not been established. Here, we show that nanocrystalline diamond thin-films covalently modified with DNA oligonucleotides provide an(More)
Understanding the suppression of ferroelectricity in perovskite thin films is a fundamental issue that has remained unresolved for decades. We report a synchrotron x-ray study of lead titanate as a function of temperature and film thickness for films as thin as a single unit cell. At room temperature, the ferroelectric phase is stable for thicknesses down(More)
Scanning force microscopy (SFM) is becoming a powerful technique with great potential both for imaging and for control of domain structures in ferroelectric materials at the nanometer scale. Application of SFM to visualization of domain structures in ferroelectric thin films is described. Imaging methods of ferroelectric domains are based on the detection(More)
We report the observation of periodic 180 degrees stripe domains below the ferroelectric transition in thin films. Epitaxial PbTiO3 films of thickness d=1.6 to 42 nm on SrTiO3 substrates were studied using x-ray scattering. Upon cooling below T(C), satellites appeared around Bragg peaks indicating the presence of 180 degrees stripe domains of period(More)
V. P. Adiga,1 A. V. Sumant,2 S. Suresh,3 C. Gudeman,3 O. Auciello,2,4 J. A. Carlisle,5 and R. W. Carpick1,6 1Department of Materials Science and Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104, USA 2Center for Nanoscale Materials, Argonne National Laboratory, Argonne, Illinois 60439, USA 3Innovative Micro Technology, Santa Barbara,(More)
Atom-probe tomography (APT) is currently the only analytical technique that, due to its spatial resolution and detection efficiency, has the potential to measure the carbon isotope ratios of individual nanodiamonds. We describe three different sample preparation protocols that we developed for the APT analysis of meteoritic nanodiamonds at sub-nm resolution(More)