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Oblivious RAM (ORAM) is an established cryptographic technique to hide a program's address pattern to an untrusted storage system. More recently, ORAM schemes have been proposed to replace conventional memory controllers in secure processor settings to protect against information leakage in external memory and the processor I/O bus. A serious problem in(More)
We present hornet, a parallel, highly configurable, cycle-level multicore simulator based on an ingress-queued wormhole router network-on-chip (NoC) architecture. The parallel simulation engine offers cycle-accurate as well as periodic synchronization; while preserving functional accuracy, this permits tradeoffs between perfect timing accuracy and high(More)
We present HORNET, a parallel, highly configurable, cycle-level multicore simulator based on an ingress-queued worm-hole router NoC architecture. The parallel simulation engine offers cycle-accurate as well as periodic synchronization; while preserving functional accuracy, this permits tradeoffs between perfect timing accuracy and high speed with very good(More)
We present DARSIM, a parallel, highly configurable, cycle-level network-on-chip simulator based on an ingress-queued wormhole router architecture. The parallel simulation engine offers cycle-accurate as well as periodic synchronization, permitting tradeoffs between perfect accuracy and high speed with very good accuracy. When run on four separate physical(More)
The sustained push for performance, transistor count and instruction level parallelism has reached a point where IC thermal issues are at the forefront of design constraints. Many of the current systems deploy dynamic voltage and frequency scaling (DVFS) to address thermal emergencies. DVFS has certain limitations in terms of response lag, scalability and(More)
OBJECTIVE The objective of our study was to report on the current practices of radiologists involved in the performance and interpretation of breast MRI in the United States. MATERIALS AND METHODS We invited the 1,696 active physician members of the Society of Breast Imaging to participate in a survey addressing whether and how they performed and(More)
As semiconductor manufacturing enters advanced nanometer design paradigm, aging and device wear-out related degradation is becoming a major concern. Negative Bias Temperature Instability (NBTI) is one of the main sources of device lifetime degradation. The severity of such degradation depends on the operation history of a chip in the field, including such(More)