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We present high-resolution aperture probes based on non-contact silicon atomic force microscopy (AFM) cantilevers for simultaneous AFM and near-infrared scanning near-field optical microscopy (SNOM). For use in near-field optical microscopy, conventional AFM cantilevers are modified by covering their tip side with an opaque aluminium layer. To fabricate an(More)
The near-field probes described in this paper are based on metallized non-contact atomic force microscope cantilevers made of silicon. For application in high-resolution near-field optical/infrared microscopy, we use aperture probes with the aperture being fabricated by focused ion beams. This technique allows us to create apertures of sub-wavelength(More)
Infrastructure consists of durable resources that are classified as "collective goods" generating external effects. The purpose of this paper is to analyse the role of spatial infrastructure on the industrial productivity in Sweden by utilising two complementary approaches: A non-parametric approach Data Envelopment Analysis and a parametric approach –(More)
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