Olivier Durand

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The durability of concrete structures is a major issue in civil engineering. Cover concrete monitoring is particularly important as it is in direct contact with the outside. High frequency surface waves (50-200 kHz) are adapted to provide information about this part of concrete, since they investigate materials at a depth close to the wavelength. The high(More)
The French national research project SENSO aims at providing a methodology combining several non destructive testing methods to evaluate indicators required for assessing the durability of concrete cover. A large set of 0.5m x 0.25m x 0.12m slabs has been built for various water/cement ratios, aggregate sizes and type. Those slabs have been subsequently(More)
In order to use nondestructive techniques (NDT) for the survey of reinforced concrete structures, it is important to show that they are able to measure the cover concrete characteristics related to its durability. For this purpose, various NDT were implemented to evaluate the mechanical and physical properties of concretes whose porosity is ranging from(More)
A new global optimization algorithm is presented and applied to the design of high-channel-count multichannel filters based on sampled Fiber Bragg Gratings. We focus on the realization of particular designs corresponding to multichannel filters that consist of 16 and 38 totally reflective identical channels spaced 100 GHz. The results are compared with(More)
(In,Ga)As/GaP(001) quantum dots (QDs) are grown by molecular beam epitaxy and studied both theoretically and experimentally. The electronic band structure is simulated using a combination of k·p and tight-binding models. These calculations predict an indirect to direct crossover with the In content and the size of the QDs. The optical properties are then(More)
This article will form part of a virtual special issue of the journal, presenting some highlights of the 12th Biennial Conference on High-Resolution X-ray Diffraction and Imaging (XTOP2014). This study is carried out in the context of III–V semiconductor monolithic integration on silicon for optoelectronic device applications. X-ray diffraction is combined(More)
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