Olaf Stern

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For obtainillg a zero defect lel'el, a high/ault coverage with respect /0 the sluck-at fOlllt model is oftell not sufficient as there are many defeels thaI show a more complex behavior. In this paper, a method is presented/or COIllPW-ilI8 tile occurrOlce probabilities oj certain defect.r and rhe realislic IOlllt coverage for test sets. The method is highly(More)
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