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  • O. Badami, Francesco Driussi, Pierpaolo Palestri, Luca Selmi, David Esseni
  • Physics
  • IEEE International Electron Devices Meeting (IEDM…
  • 1 December 2017
  • We perform a comprehensive comparison of FinFETs, stacked nanowires (stacked NWs), circular and square gate-all-around (GAA) n-FETs with same footprint, by using an in-house deterministic BTE solverContinue Reading