Nor Hisham

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This article presents a prediction of Material Removal Rate (MRR) in Electrical Discharge Machining (EDM) using Artificial Neural Network (ANN). Experimental data were gathered from Die sinking EDM process for copper-electrode and steel-workpiece. It is aimed to develop a behavioral model using input-output pattern of raw data from EDM process experiment.(More)
Many of today's very large scale integration (VLSI) chips are digital design that has hundreds of thousands to millions of transistors per chip. Testing of such large VLSI chips proves to be a challenge. One method of addressing this challenge is the introduction of design for test (DFT) features into the VLSI chips. This paper describes an efficient(More)
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