Nobuyuki Wakai

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An effective procedure to determine the burn-in acceleration factors for 90 nm system LSI are discussed in this paper. The relationship among yield, defect density, and reliability, is well known and well documented for defect mechanisms. In particular, it is important to determine the suitable acceleration factors for temperature and voltage to estimate(More)
Over the last twenty years, an increasing misconception between system level designers (OEMs) and semiconductor component (IC) providers has become very apparent relating to three specific ESD issues: ‐ ESD test specification requirements of system vs. IC providers; ‐ Understanding of ESD failures in terms of physical failure and system upset and what(More)
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