Nidhi Agrawal

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STAFAN (Statistical Fault Analysis) is a well known testability analysis program which predicts the fault coverage of a digital circuit under the stuck-at fault model, without actually performing fault simulation. STAFAN offers speed advantage over other testability analysis programs such as SCOAP; further, it explicitly predicts the fault coverage for a(More)
Von Willebrand factor (VWF) is a large, multimeric protein that regulates hemostasis by tethering platelets to the subendothelial matrix at sites of vascular damage. The procoagulant activity of plasma VWF correlates with the length of VWF multimers, which is proteolytically controlled by the metalloprotease ADAMTS13. To probe ADAMTS13 substrate(More)
In this paper, we report a tool called MODET for automatic test generation for path delay faults in modular com-binational circuits. Our technique uses precomputed robust delay tests for individual modules to compute robust delay tests for the module-level circuit. We propose a novel technique for path selection in module-level circuits and report efficient(More)
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