Nicolò Bosio

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Performance degradation of integrated circuits due to aging effects, such as Negative Bias Temperature Instability (NBTI), is becoming of great concern for current and future CMOS technology. Here we introduce an aging sensor able to detect such degradations in the combinational part of a critical data-path. It requires lower area than recently proposed(More)
Performance degradation of integrated circuits due to aging effects, such as Negative Bias Temperature Instability (NBTI), is becoming a great concern for current and future CMOS technology. In this paper we propose two monitoring and masking approaches that detect late transitions due to NBTI degradation in the combinational part of critical data-paths and(More)
The article presents the results of a work carried out by a group of nurses dealing with nursing education, both graduate (Hospital School and then University) and post graduate, since about ten years. The Authors have defined role, functions, spheres of activity, hierarchic and functional relationships, qualifications and abilities of the two new(More)
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