Nicholas J. Stessman

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Analog IC test occupies a significant fraction of the design cycle. Testing costs are increased by the twin requirements of high precision and accuracy in signal measurement. We discuss a system level ACOB technique for fully differential analog ICs. Our test techniques incorporate analog specific constraints such as device matching, and circuit and(More)
{ Analog IC test occupies a signiicant fraction of the design cycle. Testing costs are increased by the twin requirements of high precision and accuracy in signal measurement. We discuss a system level ACOB technique for fully diierential analog ICs. Our test techniques incorporate analog speciic constraints such as device matching, and circuit and(More)
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