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We report ferroelectricity and self-polarization in the (001) oriented ultrathin relaxor ferroelectric PMN-PT films grown on Nb-SrTiO3, SrRuO3 and La0.7Sr0.3MnO3, respectively. Resistance-voltage measurements and AC impedance analysis suggest that at high temperatures Schottky depletion width in a 4 nm thick PMN-PT film deposited on Nb-SrTiO3 is smaller(More)
Relaxor [011] c PMN-0.35PT single crystal phase transition characteristics are investigated through various methods including variable temperature dielectric properties, X-ray diffraction, bipolar ferroelectric hysteresis loops (P-E) and electric-field-induced strain (S-E) hysteresis loops measurements. The results reveal that two phase transitions exist(More)
Dielectric permittivity of [111]-oriented Pb(Mg<sub>1/3</sub>Nb<sub>2/3</sub>)O<sub>3</sub>-PbTiO<sub>3</sub>(PMN-PT) single crystals with various PT content and phase were investigated as a function of temperature and applied DC electric field. The temperature dependent dielectric permittivity with different PT content showed various dielectric anomalies,(More)
Four series of Pb(Mg1/3Nb2/3)O3-Pb(In1/2Nb1/2)O3-PbZrO3-PbTiO3 (PMN-PIN-PZ-PT) quaternary ceramics with compositions located at the morphotropic phase boundary (MPB) regions were prepared. The MPBs of the multicomponent system were predicted using a linear combination rule and experimentally confirmed by X-ray powder diffraction and electrical measurement.(More)
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