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N-detect test has been shown to have a higher likelihood for detecting defects. However, traditional definitions of N-detect test do not necessarily exploit the localized characteristics of defects. In physically-aware N-detect test, the objective is to ensure that the N tests establish N different logical states on the signal lines that are in the physical(More)
Physically-aware <i>N</i>-detect (<i>PAN</i>-detect) test improves defect coverage by exploiting defect locality. This paper presents physically-aware test selection (PATS) to efficiently generate <i>PAN</i>-detect tests for large industrial designs. Compared to traditional <i>N</i>-detect test, the quality resulting from <i>PAN</i>-detect is enhanced(More)
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