Nadereh Hatami

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—In recent technology nodes, reliability is considered a part of the standard design flow at all levels of embedded system design. While techniques that use only low-level models at gate-and register transfer-level offer high accuracy, they are too inefficient to consider the overall application of the embedded system. Multi-level models with high(More)
In recent technology nodes, reliability is increasingly considered a part of the standard design flow to be taken into account at all levels of embedded systems design. While traditional fault simulation techniques based on low-level models at gate-and register transfer-level offer high accuracy, they are too inefficient to properly cope with the complexity(More)
—This paper provides a methodology that leverages state-of-the-art techniques for efficient fault simulation of structural faults together with transaction level modeling. This way it is possible to accurately evaluate the impact of the faults on the entire hardware/software system.
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As the technology shrinks, nonfunctional properties (NFPs) such as reliability, vulnerability, power consumption, or heat dissipation become as important as system functionality. As NFPs often influence each other, depend on the application and workload of a system, and exhibit nonlinear behavior, NFP simulation over long periods of system operation is(More)