Nabeeh Kandalaft

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Glucocorticoids have long been implicated in the etiology of primary open-angle glaucoma (POAG) and cataract. Cortisol metabolites have biologic activity and may affect aqueous humor dynamics. This study was done to determine whether these metabolites are found in human aqueous humor and can be produced by ocular tissues. Radioimmunoassays (RIA) were(More)
Testing the integrity of interconnects realized by through silicon vias (TSVs) in 3-D integrated circuits (3-D IC) is considered a challenging task. TSVs are excessively small and fragile for current probe technology. In this paper, a new spring-type probe using microelectromechanical systems (MEMS) technology is presented. The implemented MEMS probe(More)
Signal integrity degradation at high frequencies affects test results and increases the yield loss of integrated circuits. Parasitic effects and electromagnetic coupling due to transmission lines degrade the integrity of test signals and undermine the accuracy of the measurement results. A new signal integrity enhancement technique is presented in this(More)
Given the high costs of conducting a drug-response trial, researchers are now aiming to use retrospective analyses to conduct genome-wide association studies (GWAS) to identify underlying genetic contributions to drug-response variation. To prevent confounding results from a GWAS to investigate drug response, it is necessary to account for concomitant(More)
Future wireless devices become multi-mode communication systems in order to handle different standards. This paper presents a concurrent dual-band 1.8 and 2.4GHz low noise amplifier (LNA) in response to the growing market demands for more effective LNA's with a low supply voltage and power consumption. The impedance matching of the proposed LNA targeting(More)
Keywords: Test interface module Automatic test equipment High speed manufacturing test Micro-electromechanical systems (MEMS) a b s t r a c t At frequencies above a few gigahertz, testing integrated circuits becomes a challenging task. Test signal integrity degradation due to parasitic effects of interconnects and electromagnetic coupling undermine the test(More)
In this paper, we present a new readout circuit with an integrated built-in self-test (BIST) structure for capacitive microelectromechanical system (MEMS). In the proposed solution, instead of commonly used voltage control signals to test the device, charge-controlled stimuli are employed to cover a wider range of structural defects. The proposed test(More)
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