N. N. Roshchina

We don’t have enough information about this author to calculate their statistics. If you think this is an error let us know.
Learn More
This paper reports on the ZnO film structures obtained by MOCVD method from acetylacetonate of zinc on silicon substrates at 280-320 °C substrate. The structural, emitting and transport properties of the ZnO films were examined by X-ray diffraction, Scanning electronic microscopy, Photoluminescent microscopy and Current-Voltage methods. The(More)
  • 1