N. Korsunska

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Silicon-rich Al2O3 films (Six(Al2O3)1-x) were co-sputtered from two separate silicon and alumina targets onto a long silicon oxide substrate. The effects of different annealing treatments on the structure and light emission of the films versus x were investigated by means of spectroscopic ellipsometry, X-ray diffraction, micro-Raman scattering, and(More)
The changes of structural and photoluminescence (PL) characteristics of MBE-grown CdZnSe/ZnSe single quantum well (QW) structures caused by Cd/Zn interdiffusion were studied by high-resolution X-ray diffraction (HRXRD) and low-temperature PL methods. The PL investigations showed that the increase of Cd content in the QW resulted in the increase of the depth(More)
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