N. Bruyant

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This work is focused on the electrical characterization of NiFe/Al<sub>2</sub>O<sub>3</sub>/Si tunnel diodes that can be used for spin injection into silicon. The effect of annealing on the electrical properties of the diodes has been studied by the analysis of the capacitance-voltage characteristics. This analysis shows that the Al<sub>2</sub>O<sub>3</sub>(More)
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