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Physically-aware <i>N</i>-detect (<i>PAN</i>-detect) test improves defect coverage by exploiting defect locality. This paper presents physically-aware test selection (PATS) to efficiently generate <i>PAN</i>-detect tests for large industrial designs. Compared to traditional <i>N</i>-detect test, the quality resulting from <i>PAN</i>-detect is enhanced(More)
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