Mykola Andriyovich Skoryk

We don’t have enough information about this author to calculate their statistics. If you think this is an error let us know.
Learn More
Micro/nanosized carbon materials were prepared by electrochemical exfoliation method in the forms of the colloids and thin films. Scanning electronic microscopy, optical and luminescent microscopy, and Raman scattering and luminescent spectroscopy were applied for characterization of materials. The wide photoluminescence band in the visible spectral region(More)
Our research was aimed at the study of aluminum films and porous anodic alumina (PAA) films in thin-film РАА/Al structures for optical sensors, based on metal-clad waveguides (MCWG). The results of the scanning electron microscopy (SEM) and atomic force microscopy (AFM) studies of the structure of Al films, deposited by DC magnetron sputtering, and of PAA(More)
Using a scanning electron microscopy, elemental analysis, electron paramagnetic resonance, and Raman scattering methods, two types of the shungite materials (Sh-II from Zazhogino deposit and shungite from a commercial filter (ShF)), with different carbon content and porosity, are studied in this work. It was established by scanning electron microscopy data(More)
  • 1