Moyra K. McManus

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This paper will provide a case study of a particularly dificult debug problem (the Holey Shmoo problem) which developed while designing the IBM System1390 G6 637MH.z microprocessor chip. Resolution of this problem involved the use of some of today’s newest DFDIDFT and diagnostics techniques. The discussion of the Holey Shmoo problem and its debug will serve(More)
Backside light emission and electrical measurements were used to evaluate the susceptibility to latchup of externally cabled I/O pins for a 0.13 μm technology generation [1,2] test chip, which was designed in a flip-chip package. Case studies of several Inputs/Outputs (I/Os) are shown along with conclusions regarding layout and floorplanning to ensure the(More)
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