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Carbon nanotube field effect transistors (CNFETs) show great promise as extensions to silicon CMOS. However, imperfections, which are mainly related to carbon nanotubes (CNTs) growth process, result in metallic and nonuniform CNTs leading to significant functional yield reduction. This paper presents a comprehensive technique for statistical functional(More)
High defect density and extreme process variation for nanoscale self-assembled crossbar-based architectures have been expected to be as fundamental design challenges. Consequently, defect and variation issues must be considered on logic mapping on nanoscale crossbars. In this paper, we investigate a greedy algorithm for the variation and defect aware logic(More)
Carbon Nanotube Field Effect Transistors (CNFETs), consisting of semi conducting Carbon Nanotubes (CNTs), show great promise as extensions to silicon CMOS. However, imperfections related to CNT growth process result in metallic and non-uniform CNTs leading to CNFET failures. This paper investigates a defect tolerant technique for CNFETs which adds(More)
Carbon nanotube field-effect transistors (CNFETs) show great promise as building blocks of future integrated circuits. However, synthesizing single-walled carbon nanotubes (CNTs) with accurate chirality and exact positioning control has been widely acknowledged as an exceedingly complex task. Indeed, density and chirality variations in CNT growth can(More)