Mohammed R. Madani

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In this paper, we study the impact of three-dimensional (3 4) physical defects on the functionulity of in!egrated circuit (IC) structures. A practical extension to Pi& de Gyvez and Dani 's method of IC Critical Volume modeling for open-circuits due to 3-0 defects is presented According to their approach, an open-circuit may result only when any two of the(More)
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