Miya Kawamura

We don’t have enough information about this author to calculate their statistics. If you think this is an error let us know.
Learn More
The spatial resolution of X-ray microanalysis has been investigated by Monte Carlo calculatio~s, including knock-on secondary electron production. The results for AuMa in a lOOOA thin Au film at 100 keV showed an appreciable difference from the ones without knock-out events. Also calculations have been done with the Mott cross-section instead of the(More)
  • 1