Mitsuru Sugo

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We propose a novel optical-beam-induced current (OBIC) measurement technique for detecting the degradation in the interior of a waveguide. This technique uses an incident light with a wavelength longer than that of the band edge of the active layer. An OBIC scan image was obtained at a wavelength of 1.6 lm, which was 50 nm longer than the PL peak wavelength(More)
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