In this paper we present our new educational chip. This chip is one of three chips which were designed for educational purposes within the framework of the IST project REASON. Nowadays the Boundary Scan (BS) has become to be a standard for diagnostic access to the circuits, for in-circuit programming and for several other tasks. The Boundary Scan access is… (More)
This paper summarizes work performed in ITE on development of ionizing radiation detectors integrated on-chip with readout electronics. First, the construction of such detectors will be presented in brief, together with the main features of non-typical silicon process deployed, then the test structures sent for prototyping will be discussed in detail.