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PURPOSE Epilepsy-related death, particularly sudden unexpected death in epilepsy (SUDEP), is underestimated by healthcare professionals. One argument that physicians use to justify the failure to discuss SUDEP with patients and their families is that there is a lack of evidence for any protective interventions. However, there is growing evidence of(More)
This paper summarizes the Design for Test (DFT) circuitry and test methods that enabled Intel to shift away from traditional functional testing of I/O's. This shift was one of the key enablers for Automatic Test Equipment (ATE) re-use and the move to lower capability (& cost) structural test platforms. Specific examples include circuit implementations from(More)
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