Michael W. Tian

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This paper describes a method to improve the efficiency of nonlinear DC fault simulation. The method uses the Newton-Raphson algorithm to simulate each faulty circuit. The key idea is to order the given list of faults in such a way that the solution of previous faulty circuit can serve as a good initial point for the simulation of the next faulty circuit.(More)
Fault-driven analog and mixed-signal testing calls for rapid fault simulationtechniques. A problem that has not been addressed effectivelyby existing research is that circuit parameters have tolerance ranges.In this paper, we propose representing parameters under variations asintervals, and present an efficient algorithm - based on interval analysisand(More)
|This paper presents a simulation-based approach to automatic test-frequency generation of linear analog circuits considering parameter variations. It consists of two steps. First, a candidate set of frequencies|each detects robustly some faults|is generated by a concurrent and lazy fault simulationmethod. Next, the minimum number of test frequencies to(More)
An interval-mathematic approach is presented for frequency-domain simulation and sensitivity analysis of linear analog circuits under parameter variations. With uncertain parameters represented as intervals, bounding frequency-domain responses is formulated as the problem of solving systems of linear interval equations. The formulation is based on a variant(More)
This study focuses on the utility of molecular markers for the discrimination of closely related species in tintinnid ciliates. We analyzed the ecologically important genus Helicostomella by sequencing part of the large-subunit rDNA (LSU rDNA) and the 5.8S rDNA combined with the internally transcribed spacer regions 1 and 2 (5.8S rDNA-ITS) from forty-five(More)
N egative feedback techniques are widely used in analog and RF design to improve circuit properties such as variation tolerance, bandwidth, impedance matching, and output waveform distortion. In practice, unwanted local return loops also exist around individual transistors through parasitic capacitance. As the size of transistors continues to shrink and the(More)
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