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  • Rajamani Sethuram, Michael L. Bushnell, Vishwani D. Agrawal
  • Computer Science
  • 26th IEEE VLSI Test Symposium (vts )
  • 2008 (First Published: 1 April 2008)
  • This paper presents a new fault node for implication graph that represents the Boolean detectability status of a fault in the circuit. An implication graph with fault nodes is termed functional faultContinue Reading