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A new method for measuring waveguide propagation loss in silicon nanowires is presented. This method, based on the interplay between traveling ring modes and standing wave modes due to back-scattering from edge roughness, is accurate and can be used for on wafer measurement of test structures. Examples of loss measurements and fitting are reported.
The surface plasmon resonance (SPR) technique is a well-known optical method that can be used to measure the refractive index of organic nano-layers adsorbed on a thin metal film. Although there are many configurations for measuring biomolecular interactions, SPR-based techniques play a central role in many current biosensing experiments, since they are the… (More)
A polarization splitter and rotator that is compatible with optical integration is presented. In contrast to prior efforts to achieve this functionality, the adiabatic nature of this approach allows for nearly ideal performance over the 1.5-1.6µm regime. High index contrast waveguides allow for small bend radii and thus enable dense integration of optical… (More)
We propose an approach to a wavelength-selective 1×N port optical broadcast network demonstrating the approach in a 1×8 port parallel optical drop filter bank utilizing adiabatic micro-ring tunable filters. The micro-ring filters exhibit first-order 92.7±3.7 GHz full width at half-maximum bandwidths with a 36.2 nm free spectral range, low-drop power… (More)
The translation matrix formalism has been used to find an exact analytic solution for linear light propagation in a finite one-dimensional periodic stratified structure. This modal approach allows us to derive a closed formula for the electric field in every point of the structure, by simply imposing a convenient form for the boundary conditions. We show… (More)