Massimo Vanzi

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This paper presents a study of the high temperature degradation of high brightness light emitting diodes (HBLEDs) on gallium nitride. Two different families of devices, from two leading manufacturers, have been submitted to thermal stress: during treatment, the optical and electrical characteristics of the devices have been analyzed. Degradation modes(More)
– This paper presents an automatic alignment procedure for a 4-Source Photometric Stereo technique to reconstruct the depth map in the Scanning Electron Microscopy. PS, based on the so-called reflectance map, used several images of a surface to estimate the surface depth at each image point. Lambertian reflectivity function is the simplest one. In the SEM(More)