Markus Seuring

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Space compaction of test responses provides parallel access to functional outputs and reduces delays on functional paths between cores. We present a new space compaction approach for IP cores that only uses information about the fault-free responses for a precomputed test set T. It does not make any assumption about an underlying fault model, and it does(More)
In this paper a new structural method for linear output space compaction is presented. The method is applicable to concurrent checking and built-in self test (BIST). Based on simple estimates for the probabilities of the existence of sensitized paths from the signal lines to the circuit outputs output partitions are determined without fault simulation. For(More)
Built-in self-test (BIST) is an attractive design-for-test methodology for core-based SoC design because of the minimal need for test access when tests are generated and evaluated within the core itself. However, the scan based logic BIST approach being widely considered for this application suffers from two significant weaknesses: slow test-per-scan(More)
—Space compaction of test responses provides parallel access to functional outputs and reduces testing time and test data volume. We present a new space compaction approach that only uses information about the fault-free responses for a precomputed test set. It is, therefore, especially suitable for embedded cores. It does not make any assumption about an(More)
In this paper output space compaction for sequential circuits is considered for the rst time. Based on simple estimates for the probabilities of the existence of sensitized paths from the signal lines to the circuit outputs, optimal output partitions can be determined without fault simulation. The outputs are partitioned in such a way that internal stuck-at(More)
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